Re: Inaugural Particle Summit
24 August 2010: - Malvern, UK: Organisers of the two-day Particle Summit, which takes place near Boston in October (October 20-21, 2010; The Charles Hotel, Cambridge MA), have announced two further speakers for the event, adding to an already packed program:
•Dr Joerg Bolze from analytical X-ray company PANalytical will discuss ‘Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform’. He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders, and nanocomposites.
•Alon Vaisman from Malvern Instruments will present ‘Particle sizing - a proven technology for process control’ in which he will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.
These additions to the program bring the number of speakers over the two days to seventeen, who between them will cover a wide range of particle characterization topics and technologies.
The event, which is sponsored by Malvern Instruments, also features an optional pre-conference workshop on October 19 where participants can learn or refresh their knowledge of the basic principles of particle characterization.
For more information, please visit:
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Inaugural Particle Summit
Registration opens for inaugural Particle Summit
Particle Summit
October 20-21, 2010
Charles Hotel, Cambridge, MA, USA
Information-rich, practical program focusing on particle and molecular characterization
Malvern, UK, July 8, 2010 - Registration is now open for the inaugural Particle Summit, an exciting new event that provides a forum for users of particle characterization technology and equipment to learn more and to connect with one another.
Sponsored by Malvern Instruments, the Particle Summit takes place on October 20-21, 2010 at the Charles Hotel, Cambridge MA, near Boston. It is intended for anyone wishing to expand their knowledge in the fields of particle and molecular characterization and promises an information-rich and practical program. As well as two days of presentations and case studies given by a host of experts, an optional pre-conference workshop on Oct 19 will cover the basic principles of particle characterization.
For a full program, registration information and details of early bird rates visit http://www.particlesummit.org/
The fifteen speakers are drawn from industry and academia, and also include specialists from Malvern. They include: Dr James Adair, Pennsylvania State University; Dr Danny Chou, Genzyme; Mr Bill Kopesky, Particle Technology Labs (PTL); Dr Martin Muschol, University of South Florida; Dr Kevin Powers, Particle Engineering Research Center, University of Florida; Dr Paul Sojka, Purdue University; and Dr Larry Weiss, Cleanwell Company. Dr Neil Lewis, Chief Technology Officer at Malvern Instruments, will give the keynote address on ‘New Particle Characterization Challenges - Physico-Chemical Measurement Needs for Emerging Industries’.
The pre-conference workshop, which will provide instruction in the basic principles of particle characterization, is recommended for anyone relatively new to the field, or who would like a refresher on the core topics being addressed in the conference.
In addition, there will be multiple opportunities to network with fellow course attendees, presenters, and Malvern personnel during the course of the conference, as well as a gala dinner at the prestigious Museum of Science Boston.
For more details about what the organizers aim to make the particle characterization event of the year, see the Particle Summit trailer at http://www.youtube.com/watch?v=kfTLdT8gsE8watch?v=kfTLdT8gsE8
For a full program, registration information and details of early bird rates visit http://www.particlesummit.org/ where you can also connect on Twitter, Linked In and via the blog.
Malvern and Malvern Instruments are registered trademarks of Malvern Instruments Ltd.
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Additional information:
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Attachments
particle_summit_logo_1 (GIF)
malvern_logo-1 (JPG)
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